The functional verification data are usually called "test vectors."

These generate test vectors by examining the structure of the logic and systematically generating tests for particular faults.

The test vectors on either side of the boundary are called boundary values.

While testing the system, various test vectors must be used to examine the system's behavior with differing inputs.

In this context is called a test vector.

Large gains are possible since any particular test vector usually only needs to set and/or examine a small fraction of the scan chain bits.

Since , we can use as a test vector in the original equation.

The first ICs were tested with test vectors created by hand.

Here, we call a test vector or test function.

Methods based on Boolean satisfiability are sometimes used to generate test vectors.