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Four-point probes are also used to measure sheet resistance of thin films.
Measurements of electronic properties by four-point probe and Hall Effect techniques.
Measurements are carried out using four-point probes.
The contacting four-point probe is often applied for single-point measurements of hard or coarse materials.
The measurement of contact resistance is most simply performed using a four-point probe although for more accurate determination, use of the transmission line method is typical.
The sheet resistance can be obtained by four-point probe measurement (Sheet resistance, Van der Pauw method).
Two-Point Probe, Four-Point Probe, Differential Hall Effect, Capacitance-Voltage Profiling, DLTS, Electron beam-induced current, and DLCP.
In a four-point probe measurement, one pair of leads is used to inject the measurement current while a second pair of leads, in parallel with the first, is used to measure the potential drop across the device.
Sintered film thicknesses ranged from 40-120m m. The Jc values of the planar samples were measured in zero applied magnetic field by a four-point probe technique at 77K on 6mm x 50mm tracks abraded in the film surface.
The utility of sheet resistance as opposed to resistance or resistivity is that it is directly measured using a four-terminal sensing measurement (also known as a four-point probe measurement) or indirectly by using a non-contact eddy current based testing device.
Los Angeles County supervisors called for a four-point probe on January 23, 1975 after hearing testimony that patients were often sedated, their ability to communicate with anyone outside the institution restricted, and detained in facilities behind locked gates and barbed wire if they tried to leave.
