magnetic force microscope

In 1996, Peter Gutmann, a computer scientist, presented a paper that suggested overwritten data could be recovered through the use of magnetic force microscope.

Magnetic domains can be observed with a magnetic force microscope to reveal magnetic domain boundaries that resemble white lines in the sketch.

Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material.

The end result should obscure any data on the drive so that only the most advanced physical scanning (e.g. using a magnetic force microscope) of the drive is likely to be able to recover any data.

Gutmann claims that intelligence agencies have sophisticated tools, including magnetic force microscopes, which together with image analysis, can detect the previous values of bits on the affected area of the media (for example hard disk).

The magnetic force microscope (MFM) is a variety of atomic force microscope, where a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface.

Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces (see magnetic force microscope, MFM), Casimir forces, solvation forces, etc.