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A field emission electron gun generates a beam with high coherence and high intensity.
As in any emission electron microscope, the objective or cathode lens determines the resolution.
This design also minimized interference of secondary emission electrons dislodged from the anode.
In 1964 Crewe developed the first field emission electron gun, a new type of electron source that enabled much higher optical quality than had previously been possible.
The electron beam gun used in EBW both produces the electrons and accelerates them, using a hot cathode emitter made of tungsten that thermionic emission electrons when heated.
Crewe and coworkers at the University of Chicago developed the cold field emission electron source and built a STEM able to visualize single heavy atoms on thin carbon substrates.
Electron Microprobe The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old.