atomic force microscopy

The company is one of the pioneers on the atomic force microscopy market in Russia.

Atomic force microscopy is a way of mapping surface features with very high resolution.

It is a combination of acoustics and atomic force microscopy.

Without cantilever transducers, atomic force microscopy would not be possible.

Quate is known as the brilliant mind behind acoustic and atomic force microscopy.

- Atomic force Microscopy: mechanical forces of the membrane.

Atomic force microscopy images of an array of 17 memristors.

Direct observation of protein secondary structure in gas vesicles by atomic force microscopy.

Atomic force microscopy can measure mechanical properties of nanotubes.

Sheet mica is used in electrical components, electronics, isinglass, and atomic force microscopy.

Simple, they convert the light absorption into bulk mechanical motion, and then sense that motion through atomic force microscopy.

Scientists based at P&G's laboratories used a technique known as atomic force microscopy to study the changes that hair undergoes when it is coloured.

The capsid and entire virus structure can be mechanically (physically) probed through atomic force microscopy.

Depending on dendron generation, the polymers differ in thickness as the atomic force microscopy image shows (Figure 2).

IBM has developed an alternative maskless lithography technique based on atomic force microscopy see here.

There are other "direct" imaging techniques as well, like atomic force microscopy (ATM).

Atomic force microscopy.

Scanning electron and atomic forces microscopy is used to examine Lego peptide nanofiber structures.

Lastly, mechanical properties of these biopolymers can often be measured using optical tweezers or atomic force microscopy.

Atomic force microscopy (AFM) images showed a significant increase in long-range order after heating.

Many mechanical and imaging techniques such as nanoindentation and atomic force microscopy are used to characterize these tissues.

Experiments on bilayers often require advanced techniques like electron microscopy and atomic force microscopy.

Currently, research on biological interfaces and bionics is Barthlott's area of central interest, mainly involving atomic force microscopy.

Conductive atomic force microscopy (c-AFM) is one such modification technique.