The introduction of new technology such as low-energy electron diffraction revolutionised the study of surfaces in the 1950s and 1960s.

Low-energy electron diffraction (LEED) is often used in combination with LEIS in order to facilitate proper sample alignment.

Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.

In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM).

Low-energy electron diffraction (LEED) is a method of bombarding a crystalline material with a collimated beam of electrons, then observing the resulting diffraction patterns to determine the structure of the material.

While there are several techniques that probe only the first few monolayers of a material, such as low-energy electron diffraction (LEED), helium atom scattering is unique in that it does not penetrate the surface of the sample at all!

Low-energy electron diffraction (LEED) is a technique for the determination of the surface structure of crystalline materials by bombardment with a collimated beam of low energy electrons (20-200 eV) and observation of diffracted electrons as spots on a fluorescent screen.

Imaging of the back focal plane of the objective lens into the object plane of the projector lens (using an intermediate lens) produces a diffraction pattern (low-energy electron diffraction, LEED) at the imaging plane and recorded in a number of different ways.

Pendry's research career started with his PhD, which was concerned with Low-energy electron diffraction (LEED), a technique for examining the surface of materials which had been discovered in the twenties but which waited for Pendry's method of computing the results to become practical.

These include X-ray photoelectron spectroscopy, Auger electron spectroscopy, low-energy electron diffraction, electron energy loss spectroscopy, thermal desorption spectroscopy, ion scattering spectroscopy, secondary ion mass spectrometry, Dual polarization interferometry, and other surface analysis methods included in the list of materials analysis methods.